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AFM (Atomic Force Microscope)

The NanoScope IV Multimode Atomic force Microscope(AFM) /Scanning Probe Microscope (SPM)is the highest resolution SPM presently available at Kuwait University, Faculty of Science. The combination of easy to use, powerful software and innovative hardware design gives the Multimode SPM the flexibility to easily acquire images on both the atomic and macroscopic scales. The microscope performs the full range of SPM techniques to measure surface characteristics including topography, elasticity, friction, adhesion, magnetic fields, and electrical fields.

 

The complete range of Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) techniques is available with the Multimode SPM:

  1. Contact Mode AFM
  2. Phase Imaging Microscopy
  3. Electric Force
  4. Surface Potential Microscopy
  5. Lateral Force Microscopy (LFM)
  6. Nanoindenting/Scratching
  7. Force Volume
  8. Electrochemical Microscopy (ECSTM and ECAFM)
  9. Tapping Mode AFM
  10. Non-contact AFM
  11. Magnetic Force Microscopy (MFM)
  12. Lift Mode
  13. Force Modulation
  14. Scanning Thermal Microscopy (SThM)
  15. Force-Distance Measurements
  16. Scanning Tunnelling Microscopy (STM)