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SEM carryscope ( Scanning Electron Microscope )

The The JEOL CarryScope is a remotely operationable scanning electron microscope which can be operated by any remote location through worldwide web. This microscope is an ideal tool to teach electron microscopy in student labs either by physically moving the instrument in the lab or by internet at distant locations where it is not possible to carry or access physically the microscope. This SEM can function at both low vacuum and high vacuum modes, with additional advantage of having both secondary and backscattered electron detectors. The stage is fully motorized in all axis- X, Y, Z and tilt. It delivers several high resolution performance imaging and analytical capabilities of conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images.

Standard features:
1- 8X to 300,000X imaging and up to 5.0nm resolution.
2- The optional eucentric motorized specimen stage (MS configuration) holds a specimen up to 150mm (6 inches) in diameter.
3- Low vacuum and multiple live image display, including picture in picture and pseudocolouring.
4- A Stage Navigation System and SmileShotTM software with smart settings for routine imaging.The customizable GUI interface allows the instrument to be easily and intuitively operated, and Smile Shot™ software ensures optimum operation settings.